Aehr Test Systems to Exhibit at the Semiconductor Wafer Test Workshop June 3-6, 2018 in San Diego CA
Will showcase FOX-XPTM solutions for wafer-level burn-in and test of logic, optical and memory devices …
Aehr Test Systems to Participate in Two Upcoming Investor Conferences
Gayn Erickson, President and CEO, and Ken Spink, CFO, to participate in annual Craig-Hallum and LD Micro…
Aehr Announces Follow-on Order for Multiple ABTS™ Burn-in and Test Systems From Wireless Chipset Manufacturer
Aehr receives $1.5 million order from wireless communications chipset company for automotive device test and…
Aehr to Exhibit at the International Reliability Physics Symposium March 11-15, 2018
Aehr today announced that it will exhibit at the International Reliability Physics Symposium (IRPS) taking…
Aehr to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 4-7, 2018; CEO Gayn Erickson to Present Keynote Address
Aehr will exhibit and Gayn Erickson will deliver the keynote address at the Burn-in and Test Strategies…
Aehr Receives New Customer Order for ABTS™ Burn-in and Test System for Military and Aerospace Application
Aehr has received a new ABTS order from a prominent United States government military and aerospace…
Aehr Receives Orders Exceeding $2.5 Million for Burn-in and Test Products for Automotive Semiconductor Devices
Aehr received orders for products and services from leading manufacturer of advanced logic ICs for automotive…
Aehr Announces New Customer for FOX-XP™ Test and Burn-in System
Aehr receives order for FOX-XP test and burn-in system for singulated bare die testing and burn-in of…
Aehr Receives Follow-on Order for FOX-XP™ Test and Burn-in System for Silicon Photonics Devices
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
Aehr to Participate in the Sixth Annual NYC Investor Summit
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
