Aehr Receives Follow-on Order for FOX-XP™ Wafer Level Test and Burn-in System for Production Test of Silicon Photonics Devices
FREMONT, Calif., Sept. 27, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Test Systems Reports First Quarter Fiscal 2019 Financial Results
FREMONT, Calif., Sept. 27, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Test Systems to Announce First Quarter Fiscal 2019 Financial Results on September 27, 2018
FREMONT, Calif., Sept. 13, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Test Systems Reports 56% Revenue Growth for Fiscal Year 2018 and Provides Financial Guidance for Fiscal 2019
Aehr announces fourth quarter and full year financial results for FY 2018 FREMONT, Calif., (GLOBE…
Aehr Test Systems to Participate in 10th Annual CEO Investor Summit 2018 in San Francisco July 11
Accredited Investor and Publishing Research Analyst Event to be Held Concurrently with SEMICON West and…
Aehr Test Systems to Exhibit at the Semiconductor Wafer Test Workshop June 3-6, 2018 in San Diego CA
Will showcase FOX-XPTM solutions for wafer-level burn-in and test of logic, optical and memory devices …
Aehr Test Systems to Participate in Two Upcoming Investor Conferences
Gayn Erickson, President and CEO, and Ken Spink, CFO, to participate in annual Craig-Hallum and LD Micro…
Aehr Announces Follow-on Order for Multiple ABTS™ Burn-in and Test Systems From Wireless Chipset Manufacturer
Aehr receives $1.5 million order from wireless communications chipset company for automotive device test and…
Aehr to Exhibit at the International Reliability Physics Symposium March 11-15, 2018
Aehr today announced that it will exhibit at the International Reliability Physics Symposium (IRPS) taking…
Aehr to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 4-7, 2018; CEO Gayn Erickson to Present Keynote Address
Aehr will exhibit and Gayn Erickson will deliver the keynote address at the Burn-in and Test Strategies…
