
Aehr Announces Order from New Customer for FOX-XP™ System for High Volume Production Test and Burn-In of Silicon Carbide (SiC) Devices
Fremont, CA (September 26, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor…

Aehr Test Systems Appoints Laura Oliphant to Board of Directors
Fremont, CA (July 18, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…

Aehr Test Systems Reports Fiscal 2019 Fourth Quarter and Full Year Results and Provides Financial Guidance for Significant Growth in Fiscal 2020
Fremont, CA (July 18, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…

Aehr Test Systems to Announce Fiscal 2019 Fourth Quarter and Full Year Financial Results on July 18, 2019
Fremont, CA (July 10, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…

Aehr Test Systems to Participate in 11th Annual CEO Investor Summit 2019 in San Francisco July 10
Fremont, CA (July 8, 2019) – Aehr Test Systems (Nasdaq: AEHR), a worldwide supplier of semiconductor test…

Aehr to Showcase FOX-NP™ Test and Reliability Qualification Solution at Semicon West 2019 in San Francisco
Fremont, CA (July 9, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…

Aehr Secures Order for FOX-P™ System from New Customer Skorpios Technologies for Test and Burn-in of Silicon Photonics Devices
Fremont, CA (June 4, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…

LD Micro Invitational 2019
LD Micro Invitational Investor Conference – June 4-5, 2019 Download: Presentation Slides (No audio)

Aehr Announces Shipments of its New FOX-CP™ and FOX-NP™ Systems in its Fiscal 2019 Fourth Quarter
FREMONT, Calif., June 03, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…

Aehr to Present at 9th Annual LD Micro Invitational Investor Conference
Los Angeles, CA / Accesswire / May 22, 2019 – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…