Aehr to Showcase FOX-NP™ Test and Reliability Qualification Solution at Semicon West 2019 in San Francisco
Fremont, CA (July 9, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…
Aehr Secures Order for FOX-P™ System from New Customer Skorpios Technologies for Test and Burn-in of Silicon Photonics Devices
Fremont, CA (June 4, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…
LD Micro Invitational 2019
LD Micro Invitational Investor Conference – June 4-5, 2019 Download: Presentation Slides (No audio)
Aehr Announces Shipments of its New FOX-CP™ and FOX-NP™ Systems in its Fiscal 2019 Fourth Quarter
FREMONT, Calif., June 03, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr to Present at 9th Annual LD Micro Invitational Investor Conference
Los Angeles, CA / Accesswire / May 22, 2019 – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Receives Initial Order from New Customer for Newly Released FOX-CP™ System for 100% Test and Burn-in of Devices Within the Enterprise and Data Center Market
FREMONT, Calif., May 07, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Receives Follow-on Order for FOX-XP™ Wafer Level Test and Burn-in System for High Volume Production of Silicon Photonics Devices
FREMONT, Calif., April 04, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Test Systems Reports Third Quarter Fiscal 2019 Financial Results
FREMONT, Calif., April 04, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of…
Aehr Test Systems to Announce Third Quarter Fiscal 2019 Financial Results on April 4, 2019
Fremont, CA (March 25, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…
Aehr Receives Over $2.3 Million in Orders for Services and Support from Production Test and Burn-in Customer
Fremont, CA (March 12, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test…
