FREMONT, Calif., July 11, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received orders for a FOX-15 wafer-level burn-in system and a WaferPak cartridge aligner from a leading communication equipment manufacturer. “We…
FREMONT, Calif., June 6, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced receipt of a follow-on order for its advanced ABTS high-power burn-in system from a leading logic, analog and mixed signal semiconductor manufacturer. Commenting…
FREMONT, Calif., June 4, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received an order for an additional FOX-1 system to a leading flash memory manufacturer. “We are very pleased to have received this follow-on order…
FREMONT, Calif., May 29, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Larry Anderson has been appointed Vice President of Worldwide Sales. Mr. Anderson will direct Aehr Test’s worldwide sales organizations. Mr. Anderson has…
FREMONT, Calif., March 29, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a follow-on production order for its ABTS Advanced Burn-in and Test System from a leading provider of embedded wireless technology. The system is…
FREMONT, Calif., March 29, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its ABTS Advanced Burn-in and Test System from a leading test lab in Korea. The system is configured for burning-in and testing…
FREMONT, Calif., March 29, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an additional follow-on production order for its ABTS Advanced Burn-in and Test System from a leading Japanese semiconductor integrated device…
FREMONT, Calif., Jan. 19, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced receipt of an order for its advanced ABTS high-power burn-in system from a leading logic, analog and mixed signal semiconductor manufacturer. “This customer’s…
FREMONT, Calif., Jan. 3, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, a 23-year veteran of the semiconductor test industry, has been appointed Chief Executive Officer (CEO) of the company, effective January 3,…
FREMONT, Calif., Dec. 21, 2011 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced receipt of an order in excess of $1 million for its advanced ABTSTM high power burn-in system from one of the world’s largest semiconductor manufacturers. The…