Aehr Test Systems Announces Participation In International Test Conference
FREMONT, Calif., Nov. 7, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment is participating this week in the International Test Conference in Anaheim, CA. Aehr is showcasing its FOXTM full-wafer test system and its ABTSTM burn-in and test system for…