FREMONT, Calif., Jan. 30, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of test and burn-in equipment for semiconductors and integrated optical devices, today announced that it will be exhibiting at the SPIE Photonics West 2017 Conference January 31 – February 2 in San Francisco, CA at the…
FREMONT, Calif., Dec. 02, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, will participate in the Fifth Annual Midtown CAP Investor Summit 2016 being held December 8, 2016 at Le Parker Meridien…
FREMONT, Calif., Nov. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, and Ken Spink, CFO, will present at the Craig-Hallum Seventh Annual Alpha Select Conference on Wednesday, November 16, 2016…
FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…
FREMONT, Calif., Oct. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR) (the “Company”), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received notification from the NASDAQ Stock Market LLC (“NASDAQ”) that the Company has regained compliance with the minimum…
FREMONT, Calif., Sept. 23, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has entered into a definitive purchase agreement for the sale of approximately $5.9 million in shares of its common stock in a private placement…
FREMONT, Calif., Sept. 01, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has begun production shipments to its initial lead customer for its FOX-1P single wafer test system and has shipped and received acceptance on the first…
FREMONT, Calif. and SEONGNAM, South Korea, Aug. 24, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, and Semics Inc., a semiconductor test equipment provider that produces fully automatic wafer handling and probing systems, today announced a development…
FREMONT, Calif., July 26, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the initial FOX-1P system, its next generation single wafer test system for high volume production and early failure rate (EFR) test, to the…
FREMONT, Calif., July 26, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received $4 million in follow-on orders for its Advanced Burn-in and Test Systems (ABTS) from a leading multi-national manufacturer of advanced logic…