FREMONT, Calif., April 06, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received a production order of $850,000 for multiple Advanced Burn-in and Test System (ABTS) thermal chambers. This order is for an initial production…
FREMONT, Calif., April 04, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received a $3.7 million follow-on order from a subcontractor to its lead customer for the FOX-XP Test and Burn-in System. The order is for a second…
FREMONT, Calif., March 06, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it is introducing a new configuration of its FOX-XP™ Test and Burn-in system that includes its new highly parallel singulated die/module test interface…
FREMONT, Calif., Feb. 21, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received an order in excess of $4 million from a subcontractor to its lead customer for the FOX-XP Test and Burn-in System. This is the initial full…
FREMONT, Calif., Feb. 08, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received an order from a subcontractor to its lead customer for its FOX-XP test and burn-in system products as the first step towards a high-volume…
FREMONT, Calif., Feb. 06, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received several follow-on orders for test and burn-in products from a leading multi-national manufacturer of advanced logic integrated circuits (ICs)…
FREMONT, Calif., Jan. 30, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of test and burn-in equipment for semiconductors and integrated optical devices, today announced that it will be exhibiting at the SPIE Photonics West 2017 Conference January 31 – February 2 in San Francisco, CA at the…
FREMONT, Calif., Dec. 02, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, will participate in the Fifth Annual Midtown CAP Investor Summit 2016 being held December 8, 2016 at Le Parker Meridien…
FREMONT, Calif., Nov. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, and Ken Spink, CFO, will present at the Craig-Hallum Seventh Annual Alpha Select Conference on Wednesday, November 16, 2016…
FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…