Category: Press Releases

Aehr Test Systems to Showcase Next Generation FOX-XP™ Test and Burn-in System at the 2016 International Test Conference in Fort Worth November 15-17

FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…

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Aehr Test Systems Regains Compliance With NASDAQ Stockholders’ Equity Rule

FREMONT, Calif., Oct. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR) (the “Company”), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received notification from the NASDAQ Stock Market LLC (“NASDAQ”) that the Company has regained compliance with the minimum…

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Aehr Test Systems and Semics Inc. Announce Manufacturing and Development Partnership for FOX™ Wafer Handling and Investment by Semics in Aehr Common Stock

FREMONT, Calif. and SEONGNAM, South Korea, Aug. 24, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, and Semics Inc., a semiconductor test equipment provider that produces fully automatic wafer handling and probing systems, today announced a development…

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