Aehr to Showcase its FOX-XP™ Next Generation Test and Burn-in Systems at the 2017 International Test Conference in Fort Worth Oct 31-Nov 2
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test at the 2017 International…