
Aehr Announces Order from New Customer for FOX-XP™ System for High Volume Production Test and Burn-In of Silicon Carbide (SiC) Devices
Fremont, CA (September 26, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it has received an initial order from a new customer for its FOX-XP Wafer Level Test and Burn-in system and WaferPak™ Contactors for production test…