
Silicon Carbide Semiconductor Supplier Selects Aehr FOX System for Wafer Level Test and Burn-in of Silicon Carbide Devices for Automotive Electric Vehicles
Fremont, CA (January 25, 2023) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced that a new customer has selected its FOX-PTM test and burn-in system to be used for qualification and production wafer level test and burn-in of…