Aehr Test Systems Announces Achievement of NAND Flash Testing Milestone on FOX-XP™ Multi-Wafer Test and Burn-In System
FREMONT, Calif., May 27, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the achievement of an important milestone in the development of its next-generation FOX-XP Wafer-Level Test and Burn-in System. The achievement of NAND flash…