Completes Approval and Acceptance of FOX-1PTM Next Generation Test System Milestone FREMONT, Calif., March 24, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its third quarter of fiscal 2016 ended February 29,…
FREMONT, Calif., March 09, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its third quarter of fiscal 2016 ended February 29, 2016 on Thursday, March 24, 2016 following the close of the market….
FREMONT, Calif., March 07, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will exhibit in Booth A28 at the 17th annual Burn-in and Test Strategies (BiTS) Workshop taking place March 6-9, 2016 in Mesa, Arizona. The BiTS…
FREMONT, Calif., Feb. 29, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received customer acceptance for and delivered its first FOX-XP Wafer Level Test and Burn-in System. The order included multiple FOX-XP WaferPak…
Net Sales for the First Six Months of $11.3 Million up 82% Year Over Year FREMONT, Calif., Jan. 12, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its second quarter of fiscal 2016 ended November 30, 2015. Fiscal…
FREMONT, Calif., Dec. 28, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its second quarter of fiscal 2016 ended November 30, 2015 on Tuesday, January 12, 2016 following the close of the market….
4th Annual Midtown CAP Investor Summit – December 10, 2015 Download: Presentation Slides (No…
FREMONT, Calif., Dec. 08, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, will participate in the Fourth Annual Midtown CAP Investor Summit 2015 being held December 10, 2015 at Le Parker Meridien…
FREMONT, Calif., Oct. 07, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the company has received its first order for its FOX-XP Wafer Level Test and Burn-in System including multiple FOX-XP WaferPak Contactors and application…
New FOX(TM) Wafer Level Test & Burn-In Application Drives Significant Sales Growth FREMONT, Calif., Sept. 24, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its first quarter of fiscal 2016 ended August 31,…