
Aehr Test Systems Announces Shipment of FOX-1P™ Next Generation Single Wafer Test System
FREMONT, Calif., July 26, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the initial FOX-1P system, its next generation single wafer test system for high volume production and early failure rate (EFR) test, to the…