FREMONT, Calif., Nov. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, and Ken Spink, CFO, will present at the Craig-Hallum Seventh Annual Alpha Select Conference on Wednesday, November 16, 2016…
FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…
Annual Shareholders’ Meeting Investor Presentation – October 18, 2016 Download: Presentation Slides (No…
FREMONT, Calif., Oct. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR) (the “Company”), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received notification from the NASDAQ Stock Market LLC (“NASDAQ”) that the Company has regained compliance with the minimum…
Reports Bookings in the First Quarter of $10.4 Million FREMONT, Calif., Sept. 29, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its first quarter of fiscal 2017 ended August 31, 2016. Fiscal First Quarter…
FREMONT, Calif., Sept. 23, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has entered into a definitive purchase agreement for the sale of approximately $5.9 million in shares of its common stock in a private placement…
FREMONT, Calif., Sept. 21, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its first quarter of fiscal 2017 ended August 31, 2016 on Thursday, September 29, 2016 following the close of the…
FREMONT, Calif., Sept. 01, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has begun production shipments to its initial lead customer for its FOX-1P single wafer test system and has shipped and received acceptance on the first…
FREMONT, Calif. and SEONGNAM, South Korea, Aug. 24, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, and Semics Inc., a semiconductor test equipment provider that produces fully automatic wafer handling and probing systems, today announced a development…
FREMONT, Calif., July 26, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the initial FOX-1P system, its next generation single wafer test system for high volume production and early failure rate (EFR) test, to the…