Category: News

Aehr Test Systems Introduces New FOX-XP™ System with Singulated Die/Module Test Configuration at Burn-in and Test Strategies Workshop in Mesa, AZ March 5-8
  • March 6, 2017

FREMONT, Calif., March 06, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it is introducing a new configuration of its FOX-XP™ Test and Burn-in system that includes its new highly parallel singulated die/module test interface…

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Aehr Test Systems Receives Order in Excess of $4 Million for FOX-XP™ Test and Burn-in System with new Singulated Die/Module Test Configuration
  • February 21, 2017

FREMONT, Calif., Feb. 21, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received an order in excess of $4 million from a subcontractor to its lead customer for the FOX-XP Test and Burn-in System. This is the initial full…

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Aehr Test Systems to Exhibit at SPIE Photonics West 2017 in San Francisco
  • January 30, 2017

FREMONT, Calif., Jan. 30, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of test and burn-in equipment for semiconductors and integrated optical devices, today announced that it will be exhibiting at the SPIE Photonics West 2017 Conference January 31 – February 2 in San Francisco, CA at the…

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Aehr Reports Second Quarter Fiscal 2017 Financial Results
  • January 5, 2017

Aehr today announced financial results for its second quarter of fiscal 2017 ended November 30, 2016 FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its second quarter of fiscal 2017 ended November 30,…

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