Aehr Test Systems to Participate in Fireside Chat at JP Morgan Chase Silicon Carbide (SiC) & Gallium Nitride (GaN) Week on June 7, 2022
Fremont, CA (June 6, 2022) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that President and CEO Gayn Erickson will participate in a fireside chat at the JP Morgan Chase Silicon Carbide (SiC) & Gallium Nitride (GaN) Week today, Tuesday,…