FREMONT, Calif., Oct. 23, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the appointment of Vernon Rogers as Executive Vice President of Sales and Marketing. In this position, Rogers will oversee all aspects of the Company’s customer facing sales, marketing, and support team which includes the Company’s direct sales, marketing, and support team, distributors and representatives in Asia and Europe, and the Company’s subsidiaries in Japan and Germany.

During the past 22 years, Rogers has held numerous senior executive sales, marketing and operations management positions, successfully building multi-channel sales distribution and support organizations at both public and start-up technology companies in the semiconductor and system level test space.

His career has focused on nanoscale inspection, manufacturing, and test technologies with such leaders as LitePoint (acquired by Teradyne), Credence Systems Corporation (acquired by Xcerra), NPTest (acquired by Credence Systems) and Schlumberger Automated Test Equipment. He also oversaw sales for FlexStar Technology, a Bay Area leader in hard disk drives (HDD) and solid-state disk drives (SSD) test and burn-in. Rogers joins Aehr Test from Global Equipment Services (GES), a global semiconductor services equipment Company, where he served in sales and marketing prior to its acquisition by Kimball Electronics.

Aehr Test President and CEO Gayn Erickson commented, “Vernon brings an exceptional background and an extensive set of skills and experiences in sales and marketing in both semiconductor and system level test. We are very excited to have him join Aehr Test at this important point in the roll out and deployment of our new family of test solutions.

“Over the past few years, we have successfully developed a family of test and burn in systems based on a unique and differentiated platform solution that addresses the growing need for high reliability test and burn in of devices in the automotive, mobile, communications, data storage, and emerging IOT sensors and systems. With our success in winning prominent lead customers within these key markets, our focus has broadened from product and solution development of these new platforms with our lead customers to further expanding our market and customer penetration in these fast growing markets.

“With our new line of FOX wafer level and singulated die and module test and burn in solutions, as well as our family of ABTS Advance Burn-in and Test Solutions, we believe we are well positioned to capture a significant increase in our overall market share of the semiconductor and system level test markets and the addition of Vernon to our team will help us grow our sales significantly over the next few years.”

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX-P™ families of test and burn-in systems and FOX WaferPak™ Aligner, FOX-XP WaferPak Contactor, FOX DiePak^® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP system is a full wafer contact and singulated die/module test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.

Contacts:
Aehr Test Systems Vernon Rogers EVP Sales and Marketing (510) 623-9400 x215 vrogers@aehr.com	MKR Investor Relations Inc. Todd Kehrli or Jim Byers Analyst/Investor Contact (213) 277-5550 aehr@mkr-group.com