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Aehr Test Systems to Showcase its FOX-XP™ Test and Burn-in Systems at SEMICON West in San Francisco July 11-13, 2017
FREMONT, Calif., July 10, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test at the 2017…