FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Robert Anderson will be retiring from its board of directors at the end of his current term, following the conclusion of the company’s 2017 annual meeting of stockholders on October 26, 2017.

Mr. Anderson first joined the Aehr Test board in the late 1980s and served for five years when it was a private company. He rejoined the board following his election in November 2000 and served for another 17 years. He currently serves as a director at Energetiq Technology, a private company, and was previously a director of MKS Instruments, a semiconductor components and equipment supplier, before retiring. He was also co-founder, Chairman, Chief Financial Officer and Chief Operating Officer of KLA Instruments (now KLA-Tencor), a supplier of process control and yield management solutions for the semiconductor and related nanoelectronics industries, from 1975 through 1994.

“I am very proud to have been a part of the tremendous product innovation, growth and development at Aehr Test,” said Anderson. “It has been a great pleasure to serve on the board, and I wish the company and my fellow directors all the best.”

“As a seasoned semiconductor equipment industry expert, Bob brought tremendous experience, depth of knowledge, and insight to Aehr Test,” said Rhea Posedel, Chairman and founder of Aehr Test Systems. “On behalf of the company and the entire board, I’d like to thank him for his many years of distinguished service and his significant contributions to the success of the company as a member of our board.”

Gayn Erickson, President and CEO of Aehr Test Systems, commented, “I am personally grateful to Bob for his invaluable insight and guidance as a member of our board. We will miss him and wish him all the best in his retirement.”

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has an installed base of more than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test.  Aehr Test has developed and introduced several innovative products, including the ABTS and FOX-P^TM families of test and burn-in systems, the FOX WaferPak^TM Aligner, FOX-XP WaferPak Contactor, and FOX DiePak® Carrier.  The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP^TM system is a full wafer contact and singulated die/module test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices.  The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems.  The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test System’s website at www.aehr.com.