FREMONT, Calif., Jan. 19, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced receipt of an order for its advanced ABTS high-power burn-in system from a leading logic, analog and mixed signal semiconductor manufacturer.

“This customer’s initial ABTS order is a major milestone because we believe they will purchase additional ABTS systems for both production and engineering burn-in requirements as they ramp capacity for new higher-power wireless and mobile processors,” said Gayn Erickson, chief executive officer of Aehr Test Systems. “In addition, we are excited because this is the second major account win for our ABTS high-power logic burn-in system in the last few months.”

“We believe that this customer purchased the ABTS system because it offers high capacity and a low cost of ownership for burn-in of high-power logic devices requiring individual temperature control per device,” said Carl Buck, vice president of sales and marketing of Aehr Test Systems. “The ABTS-L56i thermal chamber has a capacity for 56 burn-in boards and can dissipate 36 kilowatts, which is unmatched for production applications for high-power devices requiring individual device temperature control. The purchase signifies the successful completion of an extensive qualification of the ABTS system performed at the customer’s site.”

The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today’s devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it uses N+1 redundancy technology for many key components in the system to maximize system uptime.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOX^TM and MAX systems and the DiePak^® carrier. The ABTS system is Aehr Test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company’s website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test’s products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test’s recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.

Contacts:
Aehr Test Systems Vernon Rogers EVP Sales and Marketing (510) 623-9400 x215 vrogers@aehr.com	MKR Investor Relations Inc. Todd Kehrli or Jim Byers Analyst/Investor Contact (213) 277-5550 aehr@mkr-group.com