FREMONT, Calif., Dec. 7, 2011 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced the shipment of its 100th full-wafer contactor for use in its FOX™ family of products for wafer sort test and wafer level burn-in applications.

“This shipment is a major milestone for us, as it shows that our full-wafer contactors are becoming a significant portion of our business,” said Rhea Posedel, chairman and chief executive officer of Aehr Test Systems. “We believe our full-wafer contactor technology is unique because these contactors are used for parallel testing high die count wafers in a single touchdown. We have contacted and parallel tested some wafers with over 10,000 die and others with 60,000 contacts.”

“While most of our full-wafer contactor designs are for 300 mm wafers, we also build full-wafer contactors for very high die count applications on smaller wafers, such as 3 inch VCSEL wafers,” added Carl Buck, vice president of sales and marketing of Aehr Test Systems. “Many of our contactor designs are more challenging than those for conventional probe cards because our contactors have to operate over a wider range of temperatures, often up to 170 degrees C for automotive wafer level burn-in applications.”

Aehr Test Systems sells its full-wafer contactors along with its FOX-1 Wafer Sort Tester and FOX-15 Wafer Level Burn-in System to provide a total solution for flash memory, microcontrollers, sensors and VCSEL devices.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS™, FOX and MAX systems and the DiePak^® carrier. The ABTS system is Aehr Test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full-wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company’s website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test’s products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the FOX contactor technologies, acceptance by customers of the FOX contactors shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test’s recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC), for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.

Contacts:
Aehr Test Systems Vernon Rogers EVP Sales and Marketing (510) 623-9400 x215 vrogers@aehr.com	MKR Investor Relations Inc. Todd Kehrli or Jim Byers Analyst/Investor Contact (213) 277-5550 aehr@mkr-group.com